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Breakdown Mechanisms of Power Semiconductor Devices

Guo, HJ; Duan, BX; Wu, H; Yang, YT

Guo, HJ (reprint author), Xidian Univ, Sch Microelect, Minist Educ Wide Band Gap Semicond Mat & Devices, Key Lab, 2 South TaiBai Rd, Xian 710071, Shaanxi, Peoples R China.

IETE TECHNICAL REVIEW, 2019; 36 (3): 243

Abstract

This paper reviews the physical breakdown mechanisms of Si-, SiC- and GaN-based power semiconductor devices. In the off-state in which Si-based Latera......

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