Abstract
Semmel, RD
Semmel, RD (reprint author), Johns Hopkins Univ, Appl Phys Lab, Laurel, MD 20723 USA.; Semmel, RD (reprint author), JHU, Sch Engn, Comp Sci Informat Assurance & Informat Syst Engn, Laurel, MD 20723 USA.
JOHNS HOPKINS APL TECHNICAL DIGEST, 2018; 34 (2): 107